COMPETE, the European Thematic Network on Microelectronics Packaging and Interconnection. 
O. de Saint Leger, COMPETE co-ordination at MTA, Paris, France

Mechanical Simulation in Microelectronics and Photonics Packaging 
E. Suhir, Bell Laboratories, Lucent Technologies, Inc. USA

Electronics Trends in Mobile Communications 
H. Huomo, Research & Technology Access of Nokia Mobile Phones, Finland

Silicon Technology in the 21st Century 
A.J. van Roosmalen, Philips Semiconductors, The Netherlands

Virtual Thermo-Mechanical Prototyping of Microelectronics - The challenges for mechanics professionals 
G.Q. Zhang, P. Maessen, J. Bisschop, J. Janssen, F. Kuper, Philips, The Netherlands, L.J. Ernst, Delft University of Technology, The Netherlands

Trends in the Application of Mechanics to (Micro-) Electronics 
Dick H. van Campen, Secretary-General of IUTAM, Eindhoven University of Technology, The Netherlands

Response Surface Modelling for Non-linear Packaging Stresses 
W. van Driel, G.Q. Zhang, J.W. Bergsma, G. Steenbergen, Philips, The Netherlands, L. J. Ernst, Delft Univ. of Techn., The Netherlands

Robust Multiple Criteria Optimization of Thermally Enhanced PQFP 
Chia-Lung Chang, Wei-Shin Lin, Nat.Yunlin Univ. of Sc. & Techn. Touliu, Yunlin, Taiwan

Simplified Mechanical Model for the Thermomechanical Warpage of Microelectronic Packages Using Response Surface Methodology 
Eric Egan, National Microelectronics Research Centre (NMRC), Nat. Univ. of Ireland, Gerard Kelly, Cork Institute of Technology, Ireland, Tom O'Donovan, Statistics Department, National University of Ireland, Cork, Ireland

Parameterised Modelling of thermo-mechanical reliability for a 5x4 CSP 
B. Vandevelde, E. Beyne, IMEC, Leuven, Belgium, G.Q. Zhang, J. Caers, Philips CFT, The Netherlands

Thermo-mechanical Reliability of Multilayer Ceramic Capacitors: Measurement and Computation 
J.M.J. den Toonder, C.W. Rademaker, Philips, The Netherlands

Probabilistic Approach to Numerical Assessment of Electronic Component Reliability 
A. Wymyslowski, Wroclaw Univ. of Techn., Inst. of Microsyst. Techn., Wroclaw, Poland

Thermally Induced Delamination-Buckling in a Metal-Ceramic Microelectronic Product 
C.J. Liu, L. J. Ernst, G. Wisse, Delft Univ. of Techn., The Netherlands, G. Q. Zhang, M. Vervoort, Philips CFT, The Netherlands

Effect of Chip Anisotropy on Packaging Process Induced Stresses 
J. Janssen, W. van Driel, J. Bisschop, F. Kuper, R. Schravendeel, Y. Li, G.Q. Zhang, Philips, The Netherlands, D.G. Yang, L.J. Ernst, Delft Univ. of Techn., The Netherlands

Modelling of Heat Transfer for System In a Package (SIP) 
Jiemin Zhou, Central south Univ., Changsha, P.R. China, Xitao Wang, Liu Chen, Johan Liu, Chalmers Univ. of Techn. Gothenburg, Sweden

Actuation Unit Analysis of a Thermo-Pneaumatic Actuated Micropump 
M. Carmona, S. Marco, J. Samitier, Universitat de Barcelona, Spain,.M.C. Acero, J.A. Plaza, J. Esteve, Centro Nacional de Microelectrónica. (IMB-CSIC), Spain

A New Thermal Simulation Tool for Optimizing Laser Desoldering of Flip-Chip Components 
G. Hanreich, J. Nicolics, Vienna Univ. of Technology, Austria

Numerical Simulation of Embedded Passive Components in Multi-layer PCBs 
D. M. Stubbs, S. H. Pulko, A. J. Wilkinson, Univ. of Hull, United Kingdom

Thermal Investigation of a Jedec MO-166 Package by Finite Element Simulations 
Kirsten Weide, Univ. Hannover, Lab. für Inform. Techn

Neural Network Methodologies for Modeling, Simulation, and Optimization 
Q.J. Zhang, Carleton Univ., Ottawa, Ontario, Canada

Design for Flip Chip on Flex: A Combined Thermal & Mechanical Modeling & Analysis 
Xuejun Fan, Philips, USA

Lifetime Prediction of Extended Flip-Chip Packages under Thermal and Mechanical Loading 
B. Wunderle, W. Nüchter, Robert Bosch GmbH, Stuttgart, Germany, A. Schubert, B. Michel, Fraunhofer IZM, Berlin, Germany

High Temperature Thermo-Mechanical Analysis of Gas Sensors Substrates 
J.Puigcorbé, A.Vilà, J.R. Morante, Universitat de Barcelona, Spain

An Optimized Shear Test Sample for Assessing Solder Deformation Properties 
Tommi Reinikainen, Wei Ren, Nokia Mobile Phones, Irving, Texas

Structure Investigation of Quad Flat Non-lead Package to Improve Radio-Frequency Application 
Nansen Chen, Kevin Chiang, Charley Kuo, Kelly Liu, Terry Hsu, T. D. Her, SPIL, Taiwan

Experimental Verification of Analytical and FE-models Through Micro-Raman Spectroscopy 
Ingrid De Wolf, Imec, Leuven, Belgium

Characterisation of Lead-Free Solders in Flip Chip Joints 
S. Wiese, F. Feustel, E. Meusel, Techn. Univ. Dresden, Inst. für Halbleiter- und Mikrosystemtechnik, Germany

Time and Temperature Dependent Thermo-Mechanical Characterization and Modeling of a Packaging Molding Compound 
M. S. Kiasat, L. J. Ernst, Delft Univ. of Techn., The Netherlands, G. Q. Zhang, R. Bressers, Philips, The Netherlands

Process Induced Residual Stress Prediction for Microelectronic Packaging Materials During Cure
H.A. de Boer, M.H.H. Meuwissen, M.C. van der Wekken, TNO, The Netherlands, P.J.G. Schreurs, M.G.D. Geers, Technical Univ. of Eindhoven, The Netherlands

Material Mechanics and Reliability Issues of Lead-Free Solder Interconnects 
A. Schubert, H. Walter, E. Jung, A. Gollhardt, Fraunhofer-IZM, Berlin, Germany

Numerical Optimisation of Gold Creep Model for Thermocompression Bonding 
J. Puigcorbe, S. Marco, S. Leseduarte, Universitat de Barcelona, Spain, O. Vendier, C. Drevon, Alcatel Space, Toulouse, France, D. Floriot, Thomson-CSF-LCR, Orsay, France, H. Blanck, United Monolithic Semiconductors GmBH, Ulm, Germany, P. Auxemery, United Monolithic Semiconductors SAS, Orsay, France

Nano-scratch Behaviour of Diamond-like Carbon Films 
Li-ye Huang, Ke-wei Xu , Jian Lu, Xian Jiaotong Univ. China, Bruno Guelorget, Univ. de Techn. de Troyes, France

Measurement of Thermal Deformation of Interconnection layers Using SIEM 
Sheng Chang, Fu-Pen Chiang, State Univ. of New York at Stony Brook, USA , Yifan Guo, Motorolla Semiconductor Products Sector, Tempe Arizona, USA

Analysis of Damage Mechanisms at Miniaturized Solder Joins, Essentials for Life Time Predictions 
H.J. Albrecht, B. Schwarz, Siemens AG, Berlin, Germany

Three- and Four-Point Bend Testing for Electronic Assemblies 
Santosh Shetty, Tommi Reinikainen, Nokia Mobile Phones, Irving, Texas

Local Stress Analysis on Polymer Stud Grid Array (PSGA) Packages by Raman Spectroscopy and FEM Simula 
Jian Chen, Bart Vandevelde, Ingrid De Wolf, Imec, Leuven, Belgium, Jef Van Puymbroeck, Marcel Heerman, Siemens, Oostkamp, Belgium

Reliability Prediction of Area Array Solder Joints 
Rainer Dudek, Ralf Döring, Bernd Michel, Fraunhofer IZM, Berlin, Germany

An Integrated Modelling Approach to Solder Joint Formation and Fatigue Life Analysis 
Pan Kai-lin, Zhou De-jian, Chen zi-chen, Huang Chun-yue, Qin Kuang-yu, ZheJiang Univ., HangZhou, PRC

Packaging Induced Die Stresses Considering Time-dependence of a Moulding Compound 
J. Janssen, W. van Driel, J. Bisschop, F. Kuper, R. Schravendeel, Y. LI, R. Bressers, G.Q. Zhang, Philips, The Netherlands, M.S. Kiasat, L.J. Ernst, Delft Univ. of Techn., The Netherlands

Coupling of Mechanical and Electrical Behaviours Around a Notch Tip in Piezoelectric Medium 
Y.L. Li, Y. Sato, K. Watanabe, Univ. of Tokyo, Japan

Modelling and Simulation of an Electrostatically Actuated Surface-Micromachined Tunable Fabry-Perot Microinterferometer for the Medium IR Spectral Range 
C. Calaza, M. Moreno, S. Marco, Universitat de Barcelona, Spain, L. Fonseca, C. Cané, I. Gràcia, Centro Nacional de Microelectrónica (IMB-CSIC), Barcelona, Spain

Force Constants for liquid solder bumps with unequal padsizes 
Co Van Veen, Philips CFT, The Netherlands, Bart Vandevelde, Eric Beyne, Imec, Belgium

Numerical Simulation of Delamination in IC Packages Using a New Variable-order Singular Boundary-element 
A. A. O. Tay, K. H. Lee and K. M. Lim, Centre for IC Failure Analysis and Reliability, Nat. Univ. of Singapore

Numerical Method of Reliability Assessment of the Flip-Chip Packaging 
J. Dziduszko, A. Wymyslowski, K. Friedel, Wroclaw Univ. of Techn. Poland

Thermal Management in a New Utra-thin Chip Stack Technology 
S. Pinel, J. Tasselli, J.P. Bailbe, A. Marty, LAAS-CNRS, Toulouse, France, O. Vendier, M. Huan, ALCATEL SPACE, Toulouse, France, S. Marco, J.R. Morante, Univ. of Barcelona, Spain, E. Beyne, R. Van Hoof, IMEC, Leuven, Belgium

State-Of-The-Art of Thermo-Mechanical Modelling of IC Back-End Processes 
R.B.R. van Silfhout, A. de Boer, H.J.M. Geijselaers, Technical University of Twente, The Netherlands Y. Li , J. Bisschop, F. Kuper, R. Schravendeel, J.H.J. Janssen, W. van Driel, G.Q. Zhang , M. Jansen Philips, The Netherlands

Performance of a Thermo-Pneumatic Actuated Micropump: Influence of the Fluidic Components 
M. Carmona, S. Marco, J. Samitier, Univ. de Barcelona, SIC, Spain

SPICE Based Simulations of Electrothermal Processes 
Piotr Dziurdzia, Univ. of Mining and Metallurgy, Inst. of Electr., Kraków, Poland

A Robust Implementation of Stress Governing Equations for Next Generation Process Simulators 
Slobodan Mijalkovic, Wim Crans, Delft Univ. of Techn. ITS/DIMES

Effect of Carrier and Retain Ring Mechanism of Chemical-Mechanical Polishing of the Axial Deformation on Wafer Surface 
Zone-Ching Lin, Nat. Taiwan Univ. of Sc. & Techn.,Taipei, Taiwan

Micro to Macro Thermo-Mechanical Simulation of Wafer-Level Packaging 
C.A.Yuan, K.N. Chiang, National Tsing Hua University, Taiwan

Numerical Simulation of Reactive Interdiffusion in Thin Layers 
X. Federspiel, M. Ignat, LTPCM/INPG, France

Computer Simulation of Grain Growth in a Bidimensional Polycrystalline Films 
Jianmin Zhang, Kewei Xu, Vincent Ji, Xian Jiaotong Univ. China/ENSAM, Paris, France

Finite Element Modelling of Solder Joint Reliability of Plastic Ball Grid Assembly Under Thermal Cyclic Loading 
X. J. Zhao, Philips CFP, Singapore, G. Q. Zhang, J. Caers, Philips CFP, The Netherlands, L.J. Ernst, Delft Univ.of Techn., The Nethelands

A user-friendly thermo-mechanical stress test chip concept; does this exist ? 
Daniel Vanderstraeten, Gust Schols, Alcatel Microelectronics, Belgium, Oliver Kierse, James Molyneaux, Analog Devices Bv, Ireland, Orla Slattery, Kieran Delaney, National Microelectronics Research Centre, Ireland, Jozef Vanneuville, Klaas Decat, IMEC-KHBO, Belgium, Chan Geok Chai Moses, CS2, Belgium